首页> 外国专利> METHOD FOR MANUFACTURING SILICON CARBIDE SEMICONDUCTOR DEVICE, METHOD FOR MANUFACTURING SEMICONDUCTOR BASE, SILICON CARBIDE SEMICONDUCTOR DEVICE, AND DEVICE FOR MANUFACTURING SILICON CARBIDE SEMICONDUCTOR DEVICE

METHOD FOR MANUFACTURING SILICON CARBIDE SEMICONDUCTOR DEVICE, METHOD FOR MANUFACTURING SEMICONDUCTOR BASE, SILICON CARBIDE SEMICONDUCTOR DEVICE, AND DEVICE FOR MANUFACTURING SILICON CARBIDE SEMICONDUCTOR DEVICE

机译:制造碳化硅半导体器件的方法,制造半导体基底的方法,碳化硅半导体器件以及制造碳化硅半导体器件的设备

摘要

A method for manufacturing a silicon carbide semiconductor device comprises: a step for forming a front-surface electrode (30) on a front surface side of a silicon carbide wafer (10); a step for thinning the silicon carbide wafer (10) by reducing a thickness of the silicon carbide wafer (10) from a back surface side thereof; a step for providing a metal layer (21) on the back surface of the thinned silicon carbide wafer (10); a step for irradiating the metal layer (21) with laser light, while applying an external force such that the silicon carbide wafer and the metal layer are planarized, to form the carbide layer (20) obtained by a reaction with carbon in the silicon carbide wafer (10), on a back surface side of the metal layer (21); and a step for forming a back-surface electrode (40) on a back surface side of the carbide layer (20).
机译:制造碳化硅半导体器件的方法包括:在碳化硅晶片( 10 )的前表面侧上形成前表面电极( 30 )的步骤。 ;通过从其背面侧减小碳化硅晶片( 10 )的厚度来使碳化硅晶片( 10 )变薄的步骤;在减薄的碳化硅晶片( 10 )的背面上设置金属层( 21 )的步骤;在施加外力以使碳化硅晶片和金属层平坦化的同时,用激光照射金属层( 21 )以形成碳化物层( 20 < / B>)与金属层( 21 )的背面侧的碳化硅晶片( 10 )中的碳反应而获得;在碳化物层( 20 )的背面侧形成背面电极( 40 )的步骤。

著录项

  • 公开/公告号US2018019307A1

    专利类型

  • 公开/公告日2018-01-18

    原文格式PDF

  • 申请/专利权人 SHINDENGEN ELECTRIC MANUFACTURING CO. LTD.;

    申请/专利号US201515121002

  • 发明设计人 YUSUKE FUKADA;YOSHIYUKI WATANABE;

    申请日2015-12-11

  • 分类号H01L29/16;H01L21/285;H01L23/544;H01L21/02;H01L29/06;H01L21/78;H01L21/56;H01L23/31;

  • 国家 US

  • 入库时间 2022-08-21 13:02:43

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