ENHANCING PERFORMANCE OF ONE OR MORE SLOWER PARTITIONS OF AN INTEGRATED CIRCUIT TO IMPROVE PERFORMANCE OF THE INTEGRATED CIRCUIT

摘要

On a semiconductor die, a testing controller identifies a first partition unit with a first operating frequency lower than a second operating frequency of an adjacent second partition unit. A metal mask is added between one or more first header switches of the first partition unit and one or more second header switches of the second partition unit to allow the first partition unit to use a selection of the one or more second header switches for power distribution to the first partition unit.