首页> 外国专利> Switching element, switching element array, and resistive random access memory including switching element, and methods of manufacturing the same

Switching element, switching element array, and resistive random access memory including switching element, and methods of manufacturing the same

机译:开关元件,开关元件阵列以及包括该开关元件的电阻式随机存取存储器及其制造方法

摘要

A first electrode and an insulation material layer are sequentially formed over a substrate. A doping mask pattern is formed over the insulation material layer. The doping mask pattern exposes a portion of the insulation material layer. Dopants are injected into the exposed portion of the insulation material layer. The doping mask pattern is removed. A second electrode layer is formed over the insulation material layer. One or more pillar-shaped structures, each of which includes a second electrode, an insulation layer and a first electrode formed by respectively patterning the second electrode layer, the insulation material layer, and the first electrode layer. Each of the one or more pillar-shaped structures includes, in the insulation layer, a part of the exposed portion of the insulation material layer that is doped with the dopants. A threshold switching operation is performed in a region doped with the dopants of the insulation layer.
机译:在基板上方顺序形成第一电极和绝缘材料层。在绝缘材料层上方形成掺杂掩模图案。掺杂掩模图案暴露绝缘材料层的一部分。将掺杂剂注入到绝缘材料层的暴露部分中。掺杂掩模图案被去除。在绝缘材料层上方形成第二电极层。一个或多个柱状结构,每个柱状结构包括第二电极,绝缘层和通过分别图案化第二电极层,绝缘材料层和第一电极层而形成的第一电极。一个或多个柱状结构中的每一个在绝缘层中包括掺杂有掺杂剂的绝缘材料层的暴露部分的一部分。在掺杂有绝缘层的掺杂剂的区域中执行阈值切换操作。

著录项

  • 公开/公告号US9825099B2

    专利类型

  • 公开/公告日2017-11-21

    原文格式PDF

  • 申请/专利权人 SK HYNIX INC.;

    申请/专利号US201615231686

  • 发明设计人 JAE YEON LEE;

    申请日2016-08-08

  • 分类号H01L45;H01L27/24;

  • 国家 US

  • 入库时间 2022-08-21 12:55:22

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