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Method for performing selective etching of a semiconductor material in solution

机译:在溶液中选择性蚀刻半导体材料的方法

摘要

A method for performing selective etching of a semiconductor material in solution having the following successive steps: a) providing a substrate having a layer of amorphous semiconductor material to be etched and a layer of crystalline semiconductor material; b) oxidizing the surfaces of the layers of amorphous semiconductor material and of crystalline semiconductor material so as to form a first protective layer at the surface of the amorphous semiconductor material and a second protective layer at the surface of the crystalline semiconductor material; c) etching the first protective layer and the layer of amorphous semiconductor material with an alkaline etching solution, the etch rate v1 of the first protective layer being higher than the etch rate v2 of the second protective layer.
机译:一种用于在溶液中选择性地蚀刻半导体材料的方法,该方法具有以下连续步骤:a)提供具有待蚀刻的非晶半导体材料层和结晶半导体材料层的衬底; b)氧化非晶半导体材料和晶体半导体材料的层的表面,以在非晶半导体材料的表面形成第一保护层,并在晶体半导体材料的表面形成第二保护层; c)用碱性蚀刻溶液蚀刻第一保护层和非晶半导体材料层,第一保护层的蚀刻速率v 1 高于蚀刻速率v 2 第二保护层。

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