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The amorphous Oxide Thin Film Transistor to Enhance the Optical Reliability

机译:非晶氧化物薄膜晶体管,提高光学可靠性

摘要

The present invention provides an oxide thin film transistor. The oxide thin film transistor comprises a substrate; A gate electrode extending in the first direction on the substrate; A gate insulating film disposed on the gate electrode and disposed to cross the gate electrode; An oxide semiconductor layer disposed on the gate insulating layer and extending in a second direction perpendicular to the first direction on both sides of the gate electrode; Source and drain electrodes disposed on the oxide semiconductor layer and spaced apart from each other around the gate electrode; And a protective layer disposed on the exposed oxide semiconductor layer between the source electrode and the drain electrode. Wherein the protective layer comprises a lower protective layer composed of an insulator; A metal nanostructure disposed on the lower protective layer; And an upper protective layer composed of an insulator and disposed on the metal nanostructure.
机译:本发明提供了一种氧化物薄膜晶体管。所述氧化物薄膜晶体管包括基板;栅电极在基板上沿第一方向延伸;栅极绝缘膜设置在栅电极上并与栅电极交叉;氧化物半导体层,其设置在栅绝缘层上并在栅电极的两侧沿垂直于第一方向的第二方向延伸;源电极和漏电极设置在氧化物半导体层上并且在栅电极周围彼此间隔开;保护层设置在源电极和漏电极之间的暴露的氧化物半导体层上。其中,保护层包括由绝缘体组成的下保护层;金属纳米结构,设置在下部保护层上;以及由绝缘体组成并设置在金属纳米结构上的上保护层。

著录项

  • 公开/公告号KR101818339B1

    专利类型

  • 公开/公告日2018-02-21

    原文格式PDF

  • 申请/专利权人 고려대학교 산학협력단;

    申请/专利号KR20160053347

  • 发明设计人 성태연;김대현;김환교;임형섭;

    申请日2016-04-29

  • 分类号H01L29/786;H01L21/02;H01L29/06;H01L29/41;

  • 国家 KR

  • 入库时间 2022-08-21 12:38:37

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