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SEMICONDUCTOR DEVICE AND METHOD FOR TIME-OF-FLIGHT AND PROXIMITY MEASUREMENTS

机译:用于飞行时间和接近度测量的半导体装置和方法

摘要

An emitter (12) of electromagnetic radiation is configured for modes of operation providing fields of illumination of different widths, and a photodetector (11) is configured for time-of-flight and proximity measurements by detecting electromagnetic radiation that is emitted by the emitter and reflected to the photodetector. The emitter is operated by a driver (13), which is configured for an alternation between the modes of operation. A time-of-flight measurement is performed when the field of illumination is narrow, and a proximity or ambient light measurement is performed when the field of illumination is wide.
机译:电磁辐射的发射器(12)配置为提供不同宽度的照明场的操作模式,而光电检测器(11)则通过检测由发射器和发射器发射的电磁辐射来进行飞行时间和接近度测量。反射到光电探测器。发射器由驱动器(13)操作,驱动器(13)被配置为在操作模式之间交替。当照明范围狭窄时执行飞行时间测量,而在照明范围宽时执行接近或环境光测量。

著录项

  • 公开/公告号EP3493339A1

    专利类型

  • 公开/公告日2019-06-05

    原文格式PDF

  • 申请/专利权人 AMS AG;

    申请/专利号EP20170205180

  • 发明设计人 MÜNZER MARTIN;

    申请日2017-12-04

  • 分类号H01S5/42;G01S17/89;H01S5;

  • 国家 EP

  • 入库时间 2022-08-21 12:26:09

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