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Single sensor type three-dimensional micro/nano contact trigger measuring probe

机译:单传感器型三维微/纳米接触触发测量探头

摘要

A single sensor type three-dimensional micro/nano contact trigger measuring probe is provided which is characterized in respectively providing a probe unit and a measuring unit in the base. In the probe unit, the leaf spring is supported on the circular-ring base, a circular suspension plate is provided on the leaf spring, and beam splitter prisms and wedge block are fixedly provided on the circular suspension plate. The stylus and the circular suspension plate are fixedly connected in a “T” shape. The measuring unit projects the straight light emitted by a laser device through the beam splitter prisms and wedge block and then the straight light is focused on the four-quadrant detector. Measuring the offset of the probe by the four-quadrant detector, in such a manner that single sensor type three-dimensional micrometer contact trigger measurement is achieved.
机译:提供了一种单传感器型三维微米/纳米接触触发式测量探针,其特征在于分别在基座中提供了探针单元和测量单元。在探针单元中,板簧被支撑在圆环基座上,板簧上设置有圆形悬挂板,并且分束棱镜和楔块固定地设置在圆形悬挂板上。触控笔和圆形悬挂板以“ T”形固定连接。测量单元将激光设备发出的直射光通过分束棱镜和楔块投射,然后将直射光聚焦在四象限检测器上。通过四象限检测器测量探头的偏移,以实现单传感器类型的三维千分尺接触触发测量。

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