首页> 外国专利> Manufacturing method for AlAs—Ge—AlAs structure based plasma p-i-n diode in multilayered holographic antenna

Manufacturing method for AlAs—Ge—AlAs structure based plasma p-i-n diode in multilayered holographic antenna

机译:多层全息天线中基于AlAs-Ge-AlAs结构的等离子体P-I-N二极管的制造方法

摘要

A manufacturing method for an AlAs—Ge—AlAs structure based plasma p-i-n diode in a multilayered holographic antenna is provided. The manufacturing method includes: selecting a GeOI substrate and disposing an isolation region in the GeOI substrate; etching the GeOI substrate to form a P-type trench and an N-type trench; depositing AlAs materials in the P-type trench and the N-type trench and performing ion implantation into the AlAs materials in the P-type trench and N-type trench to form a P-type active region and an N-type active region; and forming leads on surfaces of the P-type active region and the N-type active region to obtain the AlAs—Ge—AlAs structure based plasma p-i-n diode. Therefore, a high-performance Ge based plasma p-i-n diode suitable for forming a solid plasma antenna can be provided by using a deep trench isolation technology and an ion implantation process.
机译:提供了一种多层全息天线中基于AlAs-Ge-AlAs结构的等离子体p-i-n二极管的制造方法。该制造方法包括:选择GeOI衬底,并在GeOI衬底中设置隔离区;蚀刻GeOI衬底以形成P型沟槽和N型沟槽;在P型沟槽和N型沟槽中沉积AlAs材料,并在P型沟槽和N型沟槽中的AlAs材料中进行离子注入,以形成P型有源区和N型有源区。在P型有源区和N型有源区的表面上形成引线,以获得基于AlAs-Ge-AlAs结构的等离子体p-i-n二极管。因此,可以通过使用深沟槽隔离技术和离子注入工艺来提供适合于形成固体等离子体天线的高性能的基于Ge的等离子体p-i-n二极管。

著录项

  • 公开/公告号US10304824B2

    专利类型

  • 公开/公告日2019-05-28

    原文格式PDF

  • 申请/专利权人 XIAN CREATION KEJI CO. LTD.;

    申请/专利号US201715851783

  • 发明设计人 XIAOXUE YIN;LIANG ZHANG;

    申请日2017-12-22

  • 分类号H01L27/08;H01Q7;H01L21/762;H01L21/265;H01L21/306;H01L21/02;H01L21/311;H01L21/324;H01L27/12;H01L29/06;H01L29/20;H01L29/267;H01L29/868;H01L29/66;H01Q23;H01L21/84;H01L21/8252;

  • 国家 US

  • 入库时间 2022-08-21 12:13:27

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号