首页> 外国专利> ELECTRO-DEPOSITING METAL LAYERS OF UNIFORM THICKNESS ON SEMICONDUCTING WAFERS

ELECTRO-DEPOSITING METAL LAYERS OF UNIFORM THICKNESS ON SEMICONDUCTING WAFERS

机译:半导电晶片上厚度均匀的电沉积金属层

摘要

An apparatus for the electrodeposition of metals or metal alloys on semiconductor wafers is described. The apparatus includes plating cell, an anode disposed within the plating cell, a cathode comprising a semiconductor wafer positioned with the surface to be electroplated facing and in spaced-apart relation to the anode, a power supply providing electrical contact between the anode and the cathode, a hollow bar positioned mean the cathode having a series of spaced-apart holes facing the cathode and arranged in a line extending from one end or near one end of the cross bar to the other end or near end of the cross bar and means for rotating either the cathode or the hollow bar about a central axis to spray the surface of the semiconducting wafer to be plated continuously and repeatedly as the cathode or the solution spraying means rotates.
机译:描述了一种用于在半导体晶片上电沉积金属或金属合金的设备。该装置包括:电镀池;设置在电镀池内的阳极;包括半导体晶片的阴极,该半导体晶片定位成与要电镀的表面相对且与阳极隔开,该电源在阳极和阴极之间提供电接触。空心棒的位置是指阴极,阴极具有一系列面对阴极的间隔开的孔,并排列成从横杆的一端或近端延伸到横杆的另一端或近端的直线上,随着阴极或溶液喷涂装置的旋转,使阴极或空心棒绕中心轴旋转以连续且重复地喷涂将要镀覆的半导体晶片的表面。

著录项

  • 公开/公告号SG11201811476XA

    专利类型

  • 公开/公告日2019-02-27

    原文格式PDF

  • 申请/专利权人 TECHNIC INC.;

    申请/专利号SGX11201811476

  • 发明设计人 HRADIL GEORGE;

    申请日2017-07-17

  • 分类号B05B5/04;A47L15/22;C25D5/02;C25D5/08;C25D5/16;C25D7/12;H01L21/288;H05K3/10;

  • 国家 SG

  • 入库时间 2022-08-21 12:00:04

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