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Method for depositing an epitaxial layer on a front side of a semiconductor wafer and device for carrying out the method

机译:在半导体晶片的正面上沉积外延层的方法和实施该方法的装置

摘要

Method and device for depositing an epitaxial layer on a front side of a semiconductor wafer of monocrystalline material. The method comprises providing the semiconductor wafer; disposing the semiconductor wafer on a susceptor; heating the semiconductor wafer to a deposition temperature by means of thermal radiation directed to a front and a back side of the semiconductor wafer; passing a deposition gas over the front side of the semiconductor wafer; and selectively reducing the intensity of a portion of the thermal radiation directed toward the backside of the semiconductor wafer, thereby increasing first semiconductor portion growth portions of the wafer at a uniform wafer epitaxial growth rate because of the orientation of the monocrystalline material second sub-areas to be heated weaker.
机译:在单晶材料的半导体晶片的正面上沉积外延层的方法和装置。该方法包括提供半导体晶片;将半导体晶片放置在基座上;借助于指向半导体晶片的正面和背面的热辐射将半导体晶片加热到沉积温度;使沉积气体在半导体晶片的正面上方通过;并选择性地减小指向半导体晶片背面的一部分热辐射的强度,从而由于单晶材料第二子区域的取向而以均匀的晶片外延生长速率增加晶片的第一半导体部分生长部分变弱。

著录项

  • 公开/公告号DE102017222279A1

    专利类型

  • 公开/公告日2019-06-13

    原文格式PDF

  • 申请/专利权人 SILTRONIC AG;

    申请/专利号DE201710222279

  • 申请日2017-12-08

  • 分类号C30B25/10;C30B25/12;

  • 国家 DE

  • 入库时间 2022-08-21 11:45:05

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