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Method for depositing an epitaxial layer on a front side of a semiconductor wafer and device for carrying out the method
Method for depositing an epitaxial layer on a front side of a semiconductor wafer and device for carrying out the method
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机译:在半导体晶片的正面上沉积外延层的方法和实施该方法的装置
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摘要
Method and device for depositing an epitaxial layer on a front side of a semiconductor wafer of monocrystalline material. The method comprises providing the semiconductor wafer; disposing the semiconductor wafer on a susceptor; heating the semiconductor wafer to a deposition temperature by means of thermal radiation directed to a front and a back side of the semiconductor wafer; passing a deposition gas over the front side of the semiconductor wafer; and selectively reducing the intensity of a portion of the thermal radiation directed toward the backside of the semiconductor wafer, thereby increasing first semiconductor portion growth portions of the wafer at a uniform wafer epitaxial growth rate because of the orientation of the monocrystalline material second sub-areas to be heated weaker.
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