首页> 外国专利> FINFET HAVING UPPER SPACERS ADJACENT GATE AND SOURCE/DRAIN CONTACTS

FINFET HAVING UPPER SPACERS ADJACENT GATE AND SOURCE/DRAIN CONTACTS

机译:FINFET具有较高的间距,相邻的栅极和源极/漏极触点

摘要

Processes form integrated circuit apparatuses that include parallel fins, wherein the fins are patterned in a first direction, and parallel gate structures intersect the fins in a second direction perpendicular to the first direction. Also, source/drain structures are positioned on the fins between the gate structures, source/drain contacts are positioned on the source/drain structures, sidewall insulators are positioned between the gate structures and the source/drain contacts (wherein the sidewall insulators have a lower portion adjacent to the fins and an upper portion distal to the fins), and upper sidewall spacers are positioned between the upper portion of the sidewall insulators and the source/drain contacts.
机译:工艺形成包括平行鳍片的集成电路装置,其中鳍片在第一方向上被图案化,并且平行栅极结构在垂直于第一方向的第二方向上与鳍片相交。同样,源极/漏极结构位于栅极结构之间的鳍片上,源极/漏极触点位于源极/漏极结构上,侧壁绝缘体位于栅极结构和源极/漏极触点之间(其中侧壁绝缘体具有下部与鳍片相邻,上部远离鳍片,上部侧壁间隔物位于侧壁绝缘体的上部与源极/漏极触点之间。

著录项

  • 公开/公告号US2020119000A1

    专利类型

  • 公开/公告日2020-04-16

    原文格式PDF

  • 申请/专利权人 GLOBALFOUNDRIES INC.;

    申请/专利号US201816161294

  • 申请日2018-10-16

  • 分类号H01L27/088;H01L21/8234;H01L29/78;H01L29/66;H01L29/51;

  • 国家 US

  • 入库时间 2022-08-21 11:24:49

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号