首页> 外国专利> Method for depositing an epitaxial layer on a front side of a semiconductor wafer and device for carrying out the method

Method for depositing an epitaxial layer on a front side of a semiconductor wafer and device for carrying out the method

机译:在半导体晶片的正面上沉积外延层的方法和实施该方法的装置

摘要

A method deposits an epitaxial layer on a front side of a semiconductor wafer having monocrystalline material. The method includes: providing the semiconductor wafer; arranging the semiconductor wafer on a susceptor; heating the semiconductor wafer to a deposition temperature using thermal radiation directed to the front side and to the rear side of the semiconductor wafer; conducting a deposition gas over the front side of the semiconductor wafer; and selectively reducing an intensity of a portion of the thermal radiation that is directed to the rear side of the semiconductor wafer, as a result of which first partial regions at an edge of the semiconductor wafer, in the first partial regions a growth rate of the epitaxial layer is greater than in adjacent second partial regions given uniform temperature of the semiconductor wafer owing to an orientation of the monocrystalline material, are heated more weakly.
机译:一种方法在具有单晶材料的半导体晶片的正面上沉积外延层。该方法包括:提供半导体晶片;以及将半导体晶片布置在基座上;使用指向半导体晶片的前侧和后侧的热辐射将半导体晶片加热到沉积温度;在半导体晶片的正面上传导沉积气体;选择性地减小指向半导体晶片后侧的热辐射的一部分的强度,其结果是,在半导体晶片的边缘处的第一部分区域在第一部分区域中的生长速率增加。如果由于单晶材料的取向而使半导体晶片具有均匀的温度,则外延层大于相邻的第二部分区域中的外延层被更弱地加热。

著录项

  • 公开/公告号IL275116D0

    专利类型

  • 公开/公告日2020-09-30

    原文格式PDF

  • 申请/专利权人 SILTRONIC AG;

    申请/专利号IL20200275116

  • 发明设计人

    申请日2020-06-04

  • 分类号C23C16/458;C23C16/46;C30B25/10;C30B25/12;C30B25/20;C30B29/06;H01L21/02;H01L21/67;H01L21/687;

  • 国家 IL

  • 入库时间 2022-08-21 11:17:10

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