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PRECURSORS AND PROCESSES FOR DEPOSITION OF SI-CONTAINING FILMS USING ALD AT TEMPERATURE OF 550ºC OR HIGHER

机译:在550ºC或更高温度下使用ALD沉积含Si薄膜的前驱物和方法

摘要

Methods for forming a Si-containing film on a substrate comprise heating the substrate to a temperature higher than S50°C, exposing the substrate to a vapor including a Si-containing film forming composition containing a Si-containing precursor having the formula: SiR1yR24-x-y(NH-SiR'3)x, wherein x=2, 3, 4; y=0, 1, 2, R1 and R2 each are independently selected from H, a halogen (Cl, Br, I), an C1-C4 alkyl, an isocyanate, a C1-C4 alkoxide, or an -NR3R4 group in which R3 and R4 each are independently selected from H, a C1-C4 alkyl, provided that if R3=H, R4 C1; each R' is independently selected from H, a halogen (Cl, Br, I), or a C1-C4 alkyl, and depositing the Si-containing precursor onto the substrate to form the Si-containing film on the substrate through an ALD process. The Si-containing precursor may be selected from SiH2(NH~Si(CH3)3)2, SiHCI(NH-Si(CH3)3)2, SiCI2(NH~ Si(CH3)3)2, SiH(NH-Si(CH3)3)3, SiCI(NH-Si(CH3)3)3, or Si(NH-Si(CH3)3)4.
机译:在衬底上形成含硅膜的方法包括将衬底加热到​​高于S50℃的温度,将衬底暴露于包含含分子式为SiR <的含硅前体的含硅成膜组合物的蒸气中。 Sup> 1 y R 2 4-xy (NH-SiR' 3 x ,其中x = 2、3、4; y = 0、1、2,R 1 和R 2 各自独立地选自H,卤素(Cl,Br,I),C 1 -C 4 烷基,异氰酸酯,C 1 -C 4 醇盐或-NR 3 < / Sup> R 4 组,其中R 3 和R 4 分别选自H,C 1 -C 4 烷基,条件是如果R 3 = H,则R 4 1 ;每个R'独立地选自H,卤素(Cl,Br,I)或C 1 -C 4 烷基,并将含Si的前体沉积到通过ALD工艺在基板上形成含硅膜。含Si前体可以选自SiH 2 (NH〜Si(CH 3 3 2 ,SiHCI(NH-Si(CH 3 3 2 ,SiCI 2 (NH〜Si(CH 3 3 2 ,SiH(NH-Si(CH 3 3 3 ,SiCI(NH-Si(CH 3 3 3 或Si(NH- Si(CH 3 3 4

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