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Hydrogen effects on crystallinity, photoluminescence, and magnetization of indium tin oxide thin films sputter-deposited on glass substrate without heat treatment

机译:氢对未经热处理溅射沉积在玻璃基板上的铟锡氧化物薄膜的结晶度,光致发光和磁化的影响

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摘要

Indium tin oxide (ITO) thin films were sputter deposited by using working gas containing hydrogen on glass substrate without any heat treatments. The films demonstrated X-ray diffraction due to polycrystalline ITO, blue-green photoluminescence (PL) due to oxygen defects in nano-structured ITO crystals, and paramagnetic behaviour in temperature dependence of magnetization overlapped with diamagnetic signal from the substrate. The carrier density n of the films was of the order of 1020 cm−3, and varied as an inverse of V-character with the hydrogen concentration [H] in the gas. The n value peaked at [H] = 1%. Spectral features at ≈430 and ≈470 nm of the PL emission were invariant with [H]. The order of the density of electrons N with spins obeying the Curie law was 1023 cm−3, and the variation in N with [H] was almost parallel to that in n with [H].
机译:通过使用含氢的工作气体在玻璃基板上溅射氧化铟锡(ITO)薄膜,无需任何热处理。该膜表现出多晶ITO引起的X射线衍射,纳米结构ITO晶体中的氧缺陷引起的蓝绿色光致发光(PL),以及磁化温度依赖性的顺磁行为与来自基板的抗磁信号重叠。膜的载流子密度n为1020 cm-3的量级,并且随着气体中氢浓度[H]的变化而呈V型的倒数。 n值在[H] = 1%时达到峰值。 PL发射的≈430和≈470nm处的光谱特征随[H]不变。遵循居里定律的自旋电子N的密度顺序为1023 cm-3,并且[H]的N的变化几乎与[H]的n的变化平行。

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