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Design methodologies for variation-aware integrated circuits

机译:感知变化的集成电路的设计方法

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摘要

The scaling of VLSI technology has spurred a rapid growth in the semiconductorindustry. With the CMOS device dimension scaling to and beyond 90nm technology,it is possible to achieve higher performance and to pack more complex functionalitieson a single chip. However, the scaling trend has introduced drastic variation ofprocess and design parameters, leading to severe variability of chip performance innanometer regime. Also, the manufacturing community projects CMOS will scale forthree to four more generations. Since the uncertainties due to variations are expectedto increase in each generation, it will significantly impact the performance of designand consequently the yield.Another challenging issue in the nanometer IC design is the high power consumptiondue to the greater packing density, higher frequency of operation and excessiveleakage power. Moreover, the circuits are usually over-designed to compensate foruncertainties due to variations. The over-designed circuits not only make timing closuredifficult but also cause excessive power consumption. For portable electronics,excessive power consumption may reduce battery life; for non-portable systems itmay impose great difficulties in cooling and packaging.The objective of my research has been to develop design methodologies to addressvariations and power dissipation for reliable circuit operation. The proposed workhas been divided into three parts: the first part addresses the issues related withpower/ground noise induced by clock distribution network and proposes techniques to reduce power/ground noise considering the effects of process variations. The secondpart proposes an elastic pipeline scheme for random circuits with feedback loops. Theproposed scheme provides a low-power solution that has the same variation toleranceas the conventional approaches. The third section deals with discrete buffer and wiresizing for link-based non-tree clock network, which is an energy efficient structure forskew tolerance to variations.For the power/ground noise problem, our approach could reduce the peak currentand the delay variations by 50% and 51% respectively. Compared to conventionalapproach, the elastic timing scheme reduces power dissipation by 20% ? 27%. Thesizing method achieves clock skew reduction of 45% with a small increase in powerdissipation.
机译:VLSI技术的规模化推动了半导体行业的快速增长。随着CMOS器件尺寸扩展到90nm及以上,技术可以在单个芯片上实现更高的性能并封装更复杂的功能。然而,缩放趋势已经引入了工艺和设计参数的急剧变化,从而导致芯片性能在纳米范围内的严重变化。此外,制造社区预计CMOS将扩大到四代。由于预计每代产品中由于变化引起的不确定性都会增加,这将极大地影响设计性能,进而影响良率。纳米IC设计中的另一个挑战性问题是高功耗,这归因于更大的封装密度,更高的工作频率和过度泄漏功率。而且,电路通常被过度设计以补偿由于变化引起的不确定性。过度设计的电路不仅使时序收敛困难,而且还会导致过多的功耗。对于便携式电子产品,过多的功耗可能会缩短电池寿命;对于非便携式系统,它可能在冷却和封装方面带来很大困难。我的研究目标是开发设计方法,以解决变量和功耗问题,以实现可靠的电路运行。拟议的工作分为三个部分:第一部分解决与时钟分配网络引起的电源/接地噪声有关的问题,并提出考虑工艺变化影响的降低电源/接地噪声的技术。第二部分为带有反馈回路的随机电路提出了一种弹性流水线方案。所提出的方案提供了一种具有与传统方法相同的变化容限的低功率解决方案。第三部分介绍了基于链接的非树时钟网络的离散缓冲器和布线大小,这是一种对变化有偏斜容忍的节能结构。对于电源/接地噪声问题,我们的方法可以将峰值电流和延迟变化降低50% %和51%。与传统方法相比,弹性定时方案可将功耗降低20%? 27%。该尺寸调整方法实现了时钟偏斜减少45%,而功耗却有所增加。

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  • 作者

    Samanta Rupak;

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  • 年度 2009
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