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Prognostics for electronics components of avionics - NASA IGBT accelerated ageing case study

机译:航空电子设备电子元件的预测-NASA IGBT加速老化案例研究

摘要

Insulate gate bipolar transistors (IGBTs) are widely used in electric vehicles,railway locomotive and new generation aircrafts, due to the IGBTs haveadvantages in small conduction resistance and small drive current. Hence, thereliability of IGBTs directly affect the reliability and performance of these vehiclesystems. In recent years, a series of research works about IGBT reliability,failure mode and ageing analysis have been carried out widely, and a suitableprognostics method for IGBT and an efficient algorithm for predicting the IGBTRemaining Useful Life (RUL) become increasingly important.In recent years, despite the research works on IGBT reliability, failure mode andeffect analysis are carried out widely, the prognostics and prediction of the IGBTremaining useful life are still the bottleneck in the research work to developIGBT health management system.In this thesis, a framework and algorithm of IGBT prognostics and RULprediction were developed. The research was based on the IGBT acceleratedageing experiments. The IGBT ageing data were processed and analysed, andthe mechanism of the IGBT degeneration was studied. Additionally, the IGBTdegradation models were built to simulate the IGBT degeneration processwhich were utilised to develop the prognostics algorithm for predicting the IGBTRUL.Gamma distribution model, Exponential distribution model, Poisson distributionmodel and the combining distribution model were established, and Monte Carlosimulation was utilised in the algorithm to compute the IGBT remaining usefullife. The collector emitter voltage (VCE) was used as precursor parameter inprognosis to predict the RUL. Seven IGBTs were experimented in thisprognostics research.The RUL prediction results were analysed and compared, and the prognosticsalgorithm was developed and summarised. The accuracy of the RUL predictionwas presented, and the root mean square error was utilised to analyse andcompare the efficiency and applicability of different models. The study of theIGBT prognostics and algorithm development were summarised anddemonstrated.
机译:绝缘栅双极型晶体管(IGBT)由于具有导通电阻小和驱动电流小的优点,被广泛用于电动汽车,机车和新一代飞机。因此,IGBT的可靠性直接影响这些车辆系统的可靠性和性能。近年来,关于IGBT可靠性,故障模式和老化分析的一系列研究工作已经广泛开展,并且合适的IGBT预后方法和预测IGBT剩余使用寿命(RUL)的有效算法变得越来越重要。尽管开展了有关IGBT可靠性的研究工作,但故障模式和影响分析已经广泛开展,但IGBT剩余使用寿命的预测和预测仍然是开发IGBT健康管理系统的研究工作的瓶颈。开发了IGBT的预测和RULprediction。该研究基于IGBT加速实验。处理并分析了IGBT的老化数据,研究了IGBT退化的机理。此外,建立了IGBT退化模型来模拟IGBT的退化过程,并利用该模型来开发预测IGBTRUL的预测算法。算法计算IGBT的剩余使用寿命。集电极发射极电压(VCE)被用作前体参数预后,以预测RUL。在该预后研究中对7个IGBT进行了实验,对RUL预测结果进行了分析和比较,并开发了预后算法。给出了RUL预测的准确性,并利用均方根误差来分析和比较不同模型的效率和适用性。总结并论证了IGBT的预测研究和算法开发。

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    Xie Yuanan;

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  • 年度 2013
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  • 原文格式 PDF
  • 正文语种 {"code":"en","name":"English","id":9}
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