绝缘栅双极型晶体管(IGBT)作为新能源发电转换系统的核心器件,其可靠性直接影响系统的安全运行,因此,研究IGBT可靠性对提高系统的稳定性具有重要意义.如何有效地开展IGBT加速老化试验问题是研究其可靠性的基础.基于此,这里采用多物理场建模方法对比分析了不同控制策略下功率器件老化特征参数的灵敏性,得到在恒壳温差的控制策略下结温上升了21.5℃.最后,根据该控制策略建立加速老化试验平台,证明了控制策略的有效性.因此,采用恒壳温差的加速老化试验更利于研究IGBT失效机理.%Insulated gate bipolar transistor (IGBT) plays a key role in conversion system of new energy sources whose reliability directly affects the safety of power systems, therefore it is meaningful to improve the stability of systems by studying the reliability of IGBTs. An effective accelerated ageing test is the basis for studying reliability of power electronics. Multi-physical field coupling model is used to study the sensitivity of characteristic parameters for different control strategies. lt shows that the junction temperature increases by 21. 5℃ when case temperatures are used as control variables. Lastly, a power cycling platform is established to obtain the characteristic parameters which are used to prove the effectiveness of the conclusion during ageing process according to the optimal trategy. Therefore, the accelerated ageing test using the constant temperature difference of the shell is more conducive to the study of IGBT failure mechanism.
展开▼
