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Procedures for the ageing of an electronic component group, evaluation procedures for assessing the durability of electronic components and electronic components

机译:电子元件组老化的程序,评估电子元件和电子元件耐用性的评估程序

摘要

The invention concerns a process for ageing an electronic component group (16), which includes the following steps:Yeah.cooling of the assembly (16);b.maintain the cooling temperature over a period of time;c.slag-like heating of the assembly group (16);andd.maintain the heat temperature over a period of time;andE.Repeat steps (a) to (d) until at least damage occurs to the assembly (16).The invention also concerns an evaluation procedure for assessing the durability of electronic assemblies (16) and an electronic assemblage (16).
机译:本发明涉及一种用于老化电子元件组(16)的方法,其包括以下步骤:是的组装(16); B.Ainain在一段时间内冷却温度; C.Slag样加热 组装组(16); andd.maintain在一段时间内加热温度; ande.repeat步骤(a)至(d),直到组件(16)至少发生损坏。本发明还涉及评估程序 评估电子组件(16)和电子组合(16)的耐用性。

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