首页> 美国政府科技报告 >Diffraction-Line Broadening Analysis and Stress Relaxation in Thin Metal Layers(Analyse van Diffractie-Lijnverbreding en Spanningsrelaxatie in Dunne Metaallagen)
【24h】

Diffraction-Line Broadening Analysis and Stress Relaxation in Thin Metal Layers(Analyse van Diffractie-Lijnverbreding en Spanningsrelaxatie in Dunne Metaallagen)

机译:薄金属层中的衍射线展宽分析和应力松弛(分析Dunne metaallagen中的van Diffractie-Lijnverbreding en spanningsrelaxatie)

获取原文

摘要

This thesis has been subdivided into three parts, which have diffraction-linebroadening analysis in common. In Part I a correction for the inevitable problem of truncation has been developed. In Part II the separation of size and strain broadening has been investigated. In Part III a method for determination of the orientation distribution of dislocations have been developed and applied to the analysis of the mechanism of stress relaxation in thin metal layers.

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号