首页> 美国政府科技报告 >STATISTICAL ANALYSIS OF DENSITY READINGS OF DUPONT 502 FILM BADGES AFTER EXPOSURE TO X-RAYS OF 0.07-MEV AVERAGE ENERGY
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STATISTICAL ANALYSIS OF DENSITY READINGS OF DUPONT 502 FILM BADGES AFTER EXPOSURE TO X-RAYS OF 0.07-MEV AVERAGE ENERGY

机译:0.07-mEV平均能量X射线暴露后DUpONT 502薄膜厚度读数的统计分析

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摘要

1.There is a significant linear relationship between density readings and exposure. The straight line was found to explain 99.67 percent the square of the correlation coefficient of the total variation.n2.When one reading from one badge has a density known to be associated with an unexposed badge, and three is doubt as to whether or not there has been any exposure, then the average exposure can be assumed to be blow 30 mr with 99 percent eon-fidence. For an average density found from 2 badges with 35 readings from each, the 99 percent confidence limit is 11mr

著录项

  • 作者

    Besse B. Day;

  • 作者单位
  • 年度 1957
  • 页码 1-12
  • 总页数 12
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 工业技术 ;
  • 关键词

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