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Electron Spin Lattice Relaxation in Phosphorus Doped Silicon

机译:磷掺杂硅中的电子自旋晶格弛豫

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摘要

Electron spin – lattice relaxation in phosphorus doped silicon has been investigated over a magnetic field range of 0-11,000 oersteds, a temperature range of 1.25°K., and a concentration range of 1014p/cc. to 3×1016 p/cc.nThe theoretical origins of the mechanisms are discussed. A theory is proposed to explain the concentration dependent τs mechanism, according to which rapidly relaxing close pairs of phosphorus atoms, which are few in number, relax the spins of the large number of isolated phosphorus atoms via a spin diffusion process. Experiments supporting this hypothesis are presented.

著录项

  • 作者

    A. Honig; E. Stupp;

  • 作者单位
  • 年度 1959
  • 页码 1-50
  • 总页数 50
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 工业技术;
  • 关键词

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