JOEL News. Vol. 26E, No. 2, 1989. Electron Optics Instrumentation. December 25, 1988

摘要

;CONTENTS: Micro-analysis of high T(c) superconducting oxides, Y-Ba-Cu-O system and Bi-Sr-Ca-Cu-O system; Identification of lattice defects by convergent-beam electron diffraction; Micro diffraction pattern analysis of a new phase at interface of Al/Ni film prepared by magnetron sputtering ion plating.