DETERMINATION OF THE PROPERTIES OF DIELECTRIC LAYERS ON DIELECTRIC SUBSTRATES BY THE METHOD OF RADIO WAVE ELLIPSOMETRY

摘要

This note describes a new concept whereby the physical principles of ellipsometry are applied to a simple soil/vegetation model. Although this model is simple, our preliminary results for a more complex model have shown that the conclusions drawn from the simple model are realistic and correct as a first approximation. The following assumptions have been made on the soil/vegetation model:n1. Both soil and vegetation are pure dielectrics, i. e., their electrical conductivities are negligible;n2. Both soil and vegetation are considered as homogeneous materials;n3. The soil/vegetation interface and the vegetation surface are flat, smooth, parallel planes.