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Practicality of Evaluating Soft Errors in Commercial sub-90 nm CMOS for Space Applications

机译：评估空间应用商用亚90nm CmOs软错误的实用性

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摘要

The purpose of this presentation is to: Highlight space memory evaluation evolution, Review recent developments regarding low-energy proton direct ionization soft errors, Assess current space memory evaluation challenges, including increase of non-volatile technology choices, and Discuss related testing and evaluation complexities.

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作者
Pellish, J. A.; LaBel, K. A.;
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年度 2010
页码 1-22
总页数 22
原文格式 PDF
正文语种 eng
中图分类工业技术;
关键词
Cmos ; Errors ; Proton irradiation ; Radiation effects ; Electronic equipment tests ; Spacecraft electronic equipment ; Grazing incidence ; Bragg curve ; Commercial off-the-shelf products;

机译：Cmos;错误;质子照射;辐射效应;电子设备测试;航天器电子设备;掠入射;布拉格曲线;商业现货产品;

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专利

1. A Commercial 65 nm CMOS Technology for Space Applications: Heavy Ion, Proton and Gamma Test Results and Modeling [J] . Roche P., Gasiot G., Uznanski S., Nuclear Science, IEEE Transactions on . 2010,第4期

机译：用于太空应用的商用65 nm CMOS技术：重离子，质子和伽马测试结果和建模
2. New Test Structure to Monitor Contact-to-Poly Leakage in Sub-90 nm CMOS Technologies [J] . King M.-C., Chin A. IEEE Transactions on Semiconductor Manufacturing . 2008,第2期

机译：新的测试结构，可监测低于90 nm CMOS技术中的触点对聚合物泄漏
3. Significantly Improving Sub-90 Nm Cmosfet Performances With Notch-gate Enhanced High Tensile-stress Contact Etch Stop Layer [J] . Chia-Wei Hsu, Yean-Kuen Fang, Wen-Kuan Yeh, Microelectronics reliability . 2008,第11a12期

机译：缺口门增强的高拉伸应力接触蚀刻停止层可显着提高90 Nm以下的Cmosfet性能
4. Practicality of evaluating soft errors in commercial sub-90 nm CMOS for space applications [C] . Pellish J.A., LaBel K.A. 2010 IEEE International Reliability Physics Symposium . 2010

机译：评估用于太空应用的商用90 nm以下CMOS中的软错误的实用性
5. Mitigation of Thermally Induced Soft Errors in CMOS Nanoscale Circuits [D] . Islam, Md. Sofikul. 2017

机译：CMOS纳米级电路中热诱导的软误差减轻
6. A High Full Well Capacity CMOS Image Sensor for Space Applications [O] . Woo-Tae Kim, Cheonwi Park, Hyunkeun Lee, 2019

机译：用于太空应用的高全容量CMOS图像传感器
7. Practicality of Evaluating Soft Errors in Commercial sub-90 nm CMOS for Space Applications [O] . LaBel, Kenneth A., Pellish, Jonathan A. 2010

机译：用于太空应用的商用90 nm以下CMOS软错误评估的实用性

Practicality of Evaluating Soft Errors in Commercial sub-90 nm CMOS for Space Applications

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