Development of Very Low Frequency Self-Nulling Probe for Inspection of Thick Layered Aluminum Structures

摘要

It is clear from simple skin depth considerations that steady state electromagnetic inspection of thick multi-layered conductors requires low frequency excitation. Conventional pickup sensors, however, lose sensitivity at lower frequencies. Giant magneto resistive materials offer a unique alternative for very low frequency electromagnetic NDE due to their high sensitivity to low frequency fields, small size, ease of use, and low cost. This paper outlines the development and testing of a Very Low Frequency Self-Nulling Probe incorporating a GMR sensor. The initial test results show flaw detectability at depths up to 1 cm in aluminum 2024. Optimization of the probe design based upon finite element modeling and GMR sensor characteristics (including hysteresis, linearity and saturation) is under way.