DURIP: Piezoresponse Force Microscope (PFM) with Controlled Environment for Characterization of Flexoelectric Nanostructures.

摘要

A piezo-force microscope (PFM) system was acquired under this support for characterization of flexoelectric micro/nanostructures in a controlled environment. The system was installed successfully and a few graduate students were trained by the vendor. Both piezoelectric samples and flexoelectric samples were prepared and characterized using this new system.