Experimental Studies of Vulnerabilities in Devices and On-Chip Protection

摘要

Objectives of this research: * Study effects on the fundamental units of IC circuits, ie individual devices (MOSFETs) and gates (CMOS Inverters). * Identify most prominent vulnerabilities of the units to RF direct injection and irradiation, and examine how they critically affect circuit operation. * Establish the failure mechanisms for each regime and develop hardened IC device/circuit designs. * Evaluate response of device with RF pulse parameters and use MOSFET devices as on-chip sensing and protecting elements. * Develop on-chip sensing, registration, and protection circuitry. * Develop protective nano-composite polymer based 'spin-on' coatings.