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Characterization of Temperature Dependent Index of Refraction and Thermo-Optic Coefficient for InAs and InSb (Preprint)

机译：Inas和Insb的折射率和热光系数的温度依赖性表征（预印本）

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摘要

We demonstrate the use of interferometric techniques to measure the temperature dependence of the index of refraction and thermo-optic coefficient of infrared wafer-shaped optical materials, and report our results for InAs and InSb.

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作者
DiRocco, C. ; Powers, P. ; Gillen, G. D. ; Guha, S.;
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年度 2006
页码 p.1-5
总页数 5
原文格式 PDF
正文语种 eng
中图分类工业技术;
关键词
Refractive index; Indium antimonides; Indium arsenides; Symposia; Temperature measuring instruments; Band gaps;

机译：折射率;锑化铟;砷化铟;专题讨论会;温度测量仪器;带隙;

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专利

1. Temperature-dependent refractive index measurements of wafer-shaped InAs and InSb [J] . Gillen GD, DiRocco C, Powers P, Applied optics . 2008,第2期

机译：晶片状InAs和InSb的温度相关折射率测量
2. Experimental measurement of temperature-dependent sellmeier coefficients and thermo-optic coefficients of polymers in terahertz spectral range [J] . Mumtaz Muhammad, Mahmood M. Ahsan, Khan Sabih D., Optical Materials . 2019,第MAY期

机译：太赫兹光谱范围内聚合物的温度相关塞米尔系数和热光系数的实验测量
3. Experimental measurement of temperature-dependent sellmeier coefficients and thermo-optic coefficients of polymers in terahertz spectral range [J] . Mumtaz Muhammad, Mahmood M. Ahsan, Khan Sabih D., Optical Materials . 2019,第May期

机译：太赫兹光谱范围内聚合物依赖销售系数和热光学系数的实验测量
4. Temperature Dependent Sellmeier Equations for III-V Semiconductors GaN, GaP, GaAs, GaSb, InAs and InSb [C] . Shekhar Guha, Jean Wei, Joel M. Murray Conference on Lasers and Electro-Optics . 2020

机译：III-V半导体的GaN，GaP，GaAs，GaSb，InAs和InSb的温度相关Sellmeier方程
5. The Theoretical Simulation of InAs/GaInSb and InAsN/GaInSb Strained layer Superlattice Band Gaps. [D] . Chestnut, Michael Donnell, II. 2013

机译：InAs / GaInSb和InAsN / GaInSb应变层超晶格带隙的理论模拟。
6. A Temperature-Insensitive Cladding-Etched Fiber Bragg Grating Using a Liquid Mixture with a Negative Thermo-Optic Coefficient [O] . Kwang Taek Kim, In Soo Kim, Cherl-Hee Lee, 2012

机译：使用负热光学系数的液体混合物对温度不敏感的包层蚀刻光纤布拉格光栅
7. Temperature-dependent Refractive Index Measurements of Wafer-shaped InAs and InSb [O] . Gillen, Glen D, DiRocco, Chris, Powers, Peter, 2008

机译：晶片状InAs和InSb的温度相关折射率测量

Characterization of Temperature Dependent Index of Refraction and Thermo-Optic Coefficient for InAs and InSb (Preprint)

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