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SYSTEMS FOR MEASURING ELECTRO-OPTIC AND THERMO-OPTIC COEFFICIENTS BY USING INTERFERENCE FRINGE MEASUREMENT, AND METHODS OF MEASURING ELECTRO-OPTIC AND THERMO-OPTIC COEFFICIENTS BY USING THE SYSTEMS
SYSTEMS FOR MEASURING ELECTRO-OPTIC AND THERMO-OPTIC COEFFICIENTS BY USING INTERFERENCE FRINGE MEASUREMENT, AND METHODS OF MEASURING ELECTRO-OPTIC AND THERMO-OPTIC COEFFICIENTS BY USING THE SYSTEMS
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机译:通过干涉条纹测量来测量电光和热光系数的系统,以及使用该系统来测量电光和热光系数的方法
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摘要
Measuring of an electro-optic coefficient and a thermo-optic coefficient of an optical device and an optical material, and more specifically, to measurement systems and methods of evaluating the electro-optic and thermo-optic coefficients by using interference fringe measurement techniques, wherein those optical characteristics can be precisely measured over a wide wavelength intended without using a complicated measuring equipment. The system for measuring an electro-optic coefficient includes: a light source for outputting an optical beam of multi-wavelengths, an optical interferometer including an optical beam splitter for dividing the optical beam received from the light source into two separate beams, a reference arm for receiving any one of the divided optical beams, a sample arm for receiving the other of the divided optical beams and applying a voltage to an optical sample to be measured by being connected to the optical sample, and an optical beam combiner for combining and mutually interfering optical beams that are output through the reference arm and the sample arm, and an optical spectrum analyzing device for receiving the mutually interfered optical beam from the optical interferometer and analyzing a spectrum of the mutually interfered optical beam.
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