首页> 外国专利> SYSTEMS FOR MEASURING ELECTRO-OPTIC AND THERMO-OPTIC COEFFICIENTS BY USING INTERFERENCE FRINGE MEASUREMENT, AND METHODS OF MEASURING ELECTRO-OPTIC AND THERMO-OPTIC COEFFICIENTS BY USING THE SYSTEMS

SYSTEMS FOR MEASURING ELECTRO-OPTIC AND THERMO-OPTIC COEFFICIENTS BY USING INTERFERENCE FRINGE MEASUREMENT, AND METHODS OF MEASURING ELECTRO-OPTIC AND THERMO-OPTIC COEFFICIENTS BY USING THE SYSTEMS

机译:通过干涉条纹测量来测量电光和热光系数的系统,以及使用该系统来测量电光和热光系数的方法

摘要

Measuring of an electro-optic coefficient and a thermo-optic coefficient of an optical device and an optical material, and more specifically, to measurement systems and methods of evaluating the electro-optic and thermo-optic coefficients by using interference fringe measurement techniques, wherein those optical characteristics can be precisely measured over a wide wavelength intended without using a complicated measuring equipment. The system for measuring an electro-optic coefficient includes: a light source for outputting an optical beam of multi-wavelengths, an optical interferometer including an optical beam splitter for dividing the optical beam received from the light source into two separate beams, a reference arm for receiving any one of the divided optical beams, a sample arm for receiving the other of the divided optical beams and applying a voltage to an optical sample to be measured by being connected to the optical sample, and an optical beam combiner for combining and mutually interfering optical beams that are output through the reference arm and the sample arm, and an optical spectrum analyzing device for receiving the mutually interfered optical beam from the optical interferometer and analyzing a spectrum of the mutually interfered optical beam.
机译:测量光学装置和光学材料的电光系数和热光系数,更具体地说,涉及使用干涉条纹测量技术评估电光和热光系数的测量系统和方法,其中这些光学特性可以在预期的宽波长范围内精确测量,而无需使用复杂的测量设备。用于测量电光系数的系统包括:用于输出多波长光束的光源,包括用于将从光源接收的光束划分为两个独立光束的光束分离器的光学干涉仪,参考臂用于接收任何一个被分离的光束的样品臂,用于接收另一个被分离的光束并通过与光学样品连接而向待测光学样品施加电压的样品臂,以及用于组合并相互结合的光束合成器通过参考臂和样品臂输出的干涉光束,以及用于从光学干涉仪接收相互干涉的光束并分析相互干涉的光谱的光谱分析装置。

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