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ELECTRO-OPTICAL AND THERMO-OPTIC COEFFICIENT SYSTEM USING A INTERFERENCE PATTERN MEASUREMENT WHICH DOES NOT USE COMPLEX DEVICE AND AN ELECTRO-OPTICAL AND THERMO-OPTIC COEFFICIENT MEASUREMENT USING THE SAME
ELECTRO-OPTICAL AND THERMO-OPTIC COEFFICIENT SYSTEM USING A INTERFERENCE PATTERN MEASUREMENT WHICH DOES NOT USE COMPLEX DEVICE AND AN ELECTRO-OPTICAL AND THERMO-OPTIC COEFFICIENT MEASUREMENT USING THE SAME
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机译:使用不使用复杂设备的干涉图样测量的电光和热光系数系统,以及使用相同的电光和热光系数测量
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摘要
PURPOSE: An electro-optical and thermo-optic coefficient system using a interference pattern measurement which does not use complex device and an electro-optical and thermo-optic coefficient measurement using the same are provided to use interference system structure of simple principles and samples of simple form, thereby rapidly and accurately measures an electro-optical or thermo-optic coefficient about an optical element and an optical material according to the wavelength.;CONSTITUTION: A light source(10) outputs an optical signal of multi frequency. An interferometer optic(100) comprises a light signal distribution means distributing the optical signal into two, a reference arm receiving one divided optical signal, a sample arm, and a optical signal combining means which combines and interferences optical signals outputted through the reference arm and the sample arm. A sample arm receives the other divided optical signal and adds the voltage to an optical sample. An optical spectrum analyzing device(20) receives an optical signal interfered in a interferometer optic system and analyzes the spectrum.;COPYRIGHT KIPO 2011
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