Results of X-Band Electronically Scanned Array Using an Overlapped Subarray Architecture

摘要

The measured results from all X-band electronically scanned array using an overlapped subarray architecture are presented. The 2D architecture uses a 12 x 12 element subarray with 3 to 1 overlapping. The active electronic scanned array is a receive only implementation consisting of switch, low noise amplifier, phase shifter and attenuator. Measured far-field patterns and excitation at the aperture using near-field scanner demonstrates desired design goals of a 20 degree sector beam with low sidelobes. Finally, the scan performance of the sector subarray beam is measured at 20 and 40 degrees. A three tile implementation is constructed and measured.