A suggestion by Pike (J. Sci. Instrum. 22, 222 (1962) that it should be possible to use true focusing geometry in the X-ray diffractometer was proved valid by the construction of such an attachment based on the geometry of the Seemann-Bohlin camera. A prototype model of this attachment for the Siemens diffractometer is described. With this attach¬ment, the diffractometer measures only back reflection lines since the Bragg angle 8 is derived from the original 26 angle recorded by the diffractometer by the relation 28 = 6 + 90°. Advantages of true focusing techniques are discussed, and several design alter¬natives are presented.
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