An x-ray diffractometer having 2D parallax free detector with a spherical inlet window, sharp-focused tube and focussing collimator with crossed mirror of total internal reflection is presented. The device makes it possible to obtain a Debye pattern during a period of time which is by 2 - 3 orders shorter than in the single-channel diffractometer at the same accuracy. Debye patterns can be obtained with the resolution up to 0.25 deg 2#theta# in the interval of 2#theta# up to 50 deg, accuracy of the Bragg angle determination is 0,01 deg #theta#. The sensitivity of the device provides structure determination of low-scatters, small (up to 0.2 mm) inclusions and low content of extrinsic phases.
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