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Development of an X-Ray Diffractometer for Thin Film Analyses Applying a Compact X-ray Generator with High Loaded Power Rate to a Small Focus.

机译：薄膜分析X射线衍射仪的研制分析了高负载功率施加紧凑型X射线发生器的小焦点。

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Takuo TAMURA; Asao NAKANO; Kiyoshi OGATA;
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年度 1994
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1. Microstructural Investigation of Se_xTe_(100-x) Thin Films Deposited on Si(100) Substrates by X-ray Diffractometer and Transmission Electron Microscopy Analysis [J] . Eun Tae Kim, Jeong Yong Lee, Yong Tae Kim Japanese Journal of Applied Physics. Part 1, Regular Papers, Brief Communications & Review Papers . 2007,第11Pt1期

机译：用X射线衍射仪和透射电镜分析研究沉积在Si（100）衬底上的Se_xTe_（100-x）薄膜的显微结构
2. The Role of Development of the Rotating Anode X-ray Generator and the Use of Imaging Plates in Powder Diffractometer Instrumentation [J] . Jimpei Harada Journal of Chemical Education . 2001,第5期

机译：旋转阳极X射线发生器的发展以及成像板在粉末衍射仪仪器中的作用
3. In-situ high temperature study of ceramics and ceramic ultra-thin films using a x-ray diffractometer with a parabolic multilayer mirror [J] . G. Roebben, C. Zhao, R. G. Duan Key Engineering Materials . 2002,第期

机译：使用带抛物线多层反射镜的X射线衍射仪对陶瓷和陶瓷超薄膜进行原位高温研究
4. Development of a specimen holder combined with ultra thin film laser plasma x-ray source for compact contact-type soft x-ray microscope to observe hydrated living biological cells [C] . Masahiko Ishino, Masataka Kado, Kunio Shinohara, Advances in x-ray/EUV optics and components VI . 2011

机译：结合超薄膜激光等离子体X射线源的标本架的开发，用于紧凑型接触式软X射线显微镜观察水合活生物细胞
5. Relative X-ray line intensities and their application to a single standard procedure for quantitative X-ray microanalysis of bulk samples and thin films. [D] . Hatzistergos, Michael S. 2007

机译：相对X射线谱线强度及其在单个标准程序中的应用，用于对大体积样品和薄膜进行定量X射线微分析。
6. U-shape rotating anti-cathode compact X-ray generator: 20 times stronger than the commercially available X-ray source [O] . N. Sakabe, K. Sakabe, S. Ohsawa, -1

机译：U形旋转防阴极紧凑型X射线发生器：比市售X射线源强20倍
7. X-ray diffractometer stage for in situ structural analysis of thin films [O] . Johnson R. W., Johnson W. L. 1988

机译：用于薄膜原位结构分析的X射线衍射仪台
8. X-Ray Diffractometer for the Analysis of Structure and Thermal Stability of Nanolaminate Thin Films [R] . George, S. M. 2003

机译：X射线衍射仪用于分析纳米层薄膜的结构和热稳定性

Development of an X-Ray Diffractometer for Thin Film Analyses Applying a Compact X-ray Generator with High Loaded Power Rate to a Small Focus.

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