Fault Diagnosis in FET Modules

摘要

The use of Field Effect Transistor (FET) devices in logic design has changed the design emphasis from networks composed of single logic gates to networks composed of complex functional modules. Fault diagnosis techniques which have been discussed in the literature are based on the former type networks and hence are somewhat inadequate for this new technology. This paper presents an approach to the generation of tests to detect all single and multiple faults of the stuckline type in FET modules realizing complex functions. These networks are treated in a uniform manner, and a uniform notation is adopted for the tests required for diagnosis. (Author)