Fault diagnosis of cracks in crystalline silicon photovoltaic modules through I-V curve

摘要

Photovoltaic (PV) cell cracks in wafer-based silicon PV modules are a well-known problem. In order to extract the fault characteristics of the cracked PV modules, we investigate and collect the cracked PV modules in several large PV power plants. The I-V characteristics of the cracked PV modules are tested. The test results show that the I-V curves of the cracked PV modules show a convex function step, and the reason for the I-V characteristics of the cracked PV module is analysed. A method for online diagnosis of PV module crack through I-V curve is proposed.