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Birefringence Images of Arbitrarily Oriented Dislocation Lines in (111) Silicon Wafers.

机译：（111）硅晶片中任意取向位错线的双折射图像。

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作者
Jenkins, D. A.; Plaskett, T. S.; Chaudhari, P.;
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年度 1978
页码 1-9
总页数 9
原文格式 PDF
正文语种 eng
中图分类工业技术;
关键词
Silicon; Crystal defects; Dislocations; Wafers; Birefringence; Microscopes; Chemical lasers; Single crystals; Reprints;

机译：硅;晶体缺陷;位错;晶片;双折射;显微镜;化学激光;单晶;重印;

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1. Characterization of dislocations in germanium layers grown on (011)- and (111)-oriented silicon by coplanar and noncoplanar X-ray diffraction [J] . Benediktovitch Andrei, Zhylik Alexei, Ulyanenkova Tatjana, Journal of Applied Crystallography . 2015,第3期

机译：通过共面和非共面X射线衍射表征在（011）和（111）取向硅上生长的锗层中的位错
2. Critical assessment of birefringence imaging of dislocations in 6H silicon carbide [J] . Le Thi Mai Hoa, T. Ouisse, D. Chaussende Journal of Crystal Growth . 2012,第1期

机译：关键评估6H碳化硅中的位错双折射成像
3. Multiple scattering of polarized light in uniaxial turbid media with arbitrarily oriented linear birefringence [J] . Soichi Otsuki Journal of biomedical optics . 2017,第1期

机译：偏振光在任意取向线性双折射的单轴混浊介质中的多次散射
4. Dislocation-Induced Birefringence in Silicon Carbide [C] . T. Ouisse, D. Chaussende, L. Auvray, Silicon carbide and related materials 2008 . 2008

机译：碳化硅中位错诱导的双折射
5. Study of spin-dependent transitions and spin coherence at the (111) oriented phosphorous doped crystalline silicon to silicon dioxide interface using pulsed electrically detected magnetic resonance. [D] . Paik, Seoyoung. 2011

机译：使用脉冲电检测磁共振研究（111）取向的磷掺杂晶体硅与二氧化硅界面处的自旋相关跃迁和自旋相干性。
6. Characterization of dislocations in germanium layers grown on (011)- and (111)-oriented silicon by coplanar and noncoplanar X-ray diffraction [O] . Andrei Benediktovitch, Alexei Zhylik, Tatjana Ulyanenkova, -1

机译：通过共面和非共面X射线衍射表征在（011）和（111）取向硅上生长的锗层中的位错
7. Characterization of dislocations in germanium layers grown on (011)- and (111)-oriented silicon by coplanar and noncoplanar X-ray diffraction [O] . Benediktovitch Andrei, Zhylik Alexei, Ulyanenkova Tatjana, 2015

机译：通过共面和非共面X射线衍射表征在（011）和（111）取向硅上生长的锗层中的位错
8. Optical Birefringence Images of Dislocations in Large Gallium Phosphide Crystals. [R] . Matthews, J. W., Plaskett, T. S., Blum, S. E. 1977

机译：大镓磷化物晶体中位错的光学双折射图像。

Birefringence Images of Arbitrarily Oriented Dislocation Lines in (111) Silicon Wafers.

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