Proton-Induced Single Event Upsets in the SBP9989 Microprocessor

摘要

This report describes the investigation of proton-induced single event upsets in the SBP9989 micro-processor fabricated by Texas Instruments, Inc. Ten different devices with various date codes were tested. Total dose failure occurred in five of these devices after 10 to the 12th power protons per sq cm. An average upset cross section of 6 times 10 to the minus 12th power upset-sq cm/proton-device was observed. Comparison with cosmic ray-induced upsets indicates that proton-induced upsets represent a more severe problem for satellites with orbits between 600 and 2500 nautical miles. (Author)