Multiple Material Property Characterization Using Induced Currents and Atomic Force Microscopy (Postprint).

摘要

The invention of atomic force microscope (AFM) by Binnig and his co-workers (Binnig et al., 1986) has led to the imaging of conducting and insulating surfaces with nanometer scale resolution. The AFM measures very small forces (less than nN) between a cantilever-tip and the sample surface. When the tip is brought near the surface, the interaction forces between the tip and the sample cause the cantilever to deflect. A topographic image of the surface is obtained by raster scanning the tip across the sample surface and using the interaction force as a parameter for a feedback electronics system which maintains the force at a constant set value. Since the invention of the AFM, it has become a popular tool for surface characterization and is now routinely used in many industries and academic research labs with applications in several research areas.