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Material property measurements using multiple frequency atomic force microscopy
Material property measurements using multiple frequency atomic force microscopy
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机译:使用多频原子力显微镜进行材料性能测量
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摘要
Apparatus and techniques for extracting information carried in higher eigenmodes or harmonics of an oscillating cantilever or other oscillating sensors in atomic force microscopy and related MEMs work are described. Similar apparatus and techniques for extracting information using contact resonance with multiple excitation signals are also described.
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