Optoelectronic Testing System Of Rapid, Single-Flux Quantum Circuits

摘要

We have generated picosecond voltage pulses on a superconducting microstrip lineby using a metal semiconductor metal photodiode as an optoelectronic switch. These pulses are fed into a two Josephson junction pulse shaper to generate single flux quantum (SFQ) pulses. Using a reflective electrooptic sampling system, SFQ pulses are directly observed for the first time. This important demonstration of nonintrusively detecting electrical signals from superconducting microstrip lines at the level of rapid, single flux quantum (RSFQ) circuits opens up a new way to test such circuits, on lssues such as design verification, jitter, and failure-mode testing. Further, we propose a variable rate optoelectronic clock for testing the functional speed of RSFQ logic circuits, with an adjustable clock rate up to 38 Gb/s.