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首页> 外文期刊>Physica, E. Low-dimensional systems & nanostructures >Structural and optical properties of Mn-doped ZnO nanocrystalline thin films with the different dopant concentrations
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Structural and optical properties of Mn-doped ZnO nanocrystalline thin films with the different dopant concentrations

机译:不同掺杂浓度的Mn掺杂ZnO纳米晶薄膜的结构和光学性质

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摘要

The transparent nanocrystalline thin films of undoped zinc oxide and Mn-doped (Zn_(1-x)Mn_xO) have been deposited on glass substrates via the sol-gel technique using zinc acetate dehydrate and manganese chloride as precursor. The as-deposited films with the different manganese compositions in the range of 2.5-20 at% were pre-heated at 100 °C for 1 h and 200 °C for 2 h, respectively, and then crystallized in air at 560 °C for 2 h. The structural properties and morphologies of the undoped and doped ZnO thin films have been investigated. X-ray diffraction (XRD) spectra, scanning electron microscopy (SEM), atomic force microscopy (AFM), and X-ray photoelectron spectroscopy (XPS) were used to examine the morphology and microstructure of the thin films. Optical properties of the thin films were determined by photoluminescence (PL) and UV/Vis spectroscopy. The analyzed results indicates that the obtained films are of good crystal quality and have smooth surfaces, which have a pure hexagonal wurtzite ZnO structure without any Mn related phases. Room temperature photoluminescence is observed for the ZnO and Mn-doped ZnO thin films.
机译:使用乙酸锌脱水和氯化锰作为前体,通过溶胶-凝胶技术将未掺杂的氧化锌和Mn掺杂的(Zn_(1-x)Mn_xO)透明纳米晶体薄膜沉积在玻璃基板上。将锰含量在2.5%至20%范围内的沉积薄膜分别在100°C下预热1 h和200°C下预热2 h,然后在560°C的空气中结晶10分钟。 2小时研究了未掺杂和掺杂的ZnO薄膜的结构特性和形貌。 X射线衍射(XRD)光谱,扫描电子显微镜(SEM),原子力显微镜(AFM)和X射线光电子能谱(XPS)用于检查薄膜的形貌和微观结构。通过光致发光(PL)和UV / Vis光谱法确定薄膜的光学性质。分析结果表明,所获得的膜具有良好的晶体质量并且具有光滑的表面,具有纯的六方纤锌矿型ZnO结构,没有任何Mn相关的相。对于ZnO和Mn掺杂的ZnO薄膜观察到室温光致发光。

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