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Nanoscale cathodoluminescene imaging of III-nitride-based LEDs with semipolar quantum wells in a scanning transmission electron microscope

机译:扫描透射电子显微镜中具有半极性量子阱的基于III氮化物的LED的纳米级阴极发光成像

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The optical and crystalline properties of a c-plane GaN-based LED structure with embedded semipolar InGaN quantum wells (QW) were investigated using highly spatially resolved cathodoluminescence spectroscopy (CL) directly performed in a scanning transmission electron microscope (STEM). Direct correlation of the cross-sectional STEM image with the simultaneously recorded spatially resolved CL mapping at room-temperature reveals the most intense emission coming from the semipolar InGaN QWs. We observe an inhomogeneous wavelength distribution due to local indium fluctuations and varyingQW thickness. In contrast, the donor-acceptor pair recombination (DAP) becomes the dominating luminescence process at 16K resulting in a superposition of the DAP luminescence and the InGaN QW emission. (C) 2015 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
机译:使用直接在扫描透射电子显微镜(STEM)中进行的高度空间分辨阴极发光光谱(CL)研究了具有嵌入式半极性InGaN量子阱(QW)的c平面GaN基LED结构的光学和晶体性质。横截面STEM图像与室温下同时记录的空间分辨CL映射的直接相关揭示了来自半极性InGaN QW的最强发射。我们观察到由于局部铟波动和QW厚度变化而导致的波长分布不均匀。相反,施主-受主对重组(DAP)在16K时成为主要的发光过程,导致DAP发光和InGaN QW发射重叠。 (C)2015 WILEY-VCH Verlag GmbH&Co.KGaA,Weinheim

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