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MOD multi-layer YBCO films on single-crystal substrate

机译:单晶衬底上的MOD多层YBCO膜

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摘要

Several practical applications require relatively thick Y1Ba2Cu3O7 (YBCO) coated conductors (1 -2 mu m) to carry a high critical current (I-c). However, as the thickness of the YBCO film increases, its critical current density (J(c)) decreases. In this work, we report the successful fabrication of thick YBCO films using a multiple coatings technique while maintaining a high Jc. In particular, several YBCO films with different numbers of layers were fabricated on a LaAlO3 substrate by a multiple coatings process using a trifluoroacetate metal organic deposition method (TFA-MOD). No cracks or pores were observed in cross-sectional transmission electron microscope (TEM) images of these films; further, the layers were well connected with the smooth interface. The majority of the grains in the films were c-axis oriented. Full-width at half-maximum (FWHM) values for in-plane and out-of-plane alignments for a five-layer film were 2.45 degrees and 1.2 degrees respectively. J(c) exceeding 1.6 MAcm(-2) and critical current (I-c) of 160 A cm(-1) have been obtained for a 1 mu m thick film with five layers at 77 K.
机译:几种实际应用需要相对较厚的Y1Ba2Cu3O7(YBCO)涂层导体(1-2微米)来承载高临界电流(I-c)。但是,随着YBCO膜厚度的增加,其临界电流密度(J(c))减小。在这项工作中,我们报告了在保持高Jc的情况下使用多层涂层技术成功制造了厚YBCO薄膜的过程。特别是,使用三氟乙酸金属有机沉积法(TFA-MOD)通过多次涂覆工艺在LaAlO3衬底上制备了具有不同层数的多个YBCO膜。在这些膜的截面透射电子显微镜(TEM)图像中未观察到裂纹或气孔。此外,各层与光滑的界面良好连接。薄膜中的大多数晶粒都是c轴取向的。五层膜的面内和面外对齐的半高全宽(FWHM)值分别为2.45度和1.2度。对于厚度为1μm的,在77 K下有五层的薄膜,已获得超过1.6 MAcm(-2)的J(c)和160 A cm(-1)的临界电流(I-c)。

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