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首页> 外文期刊>Solar Energy Materials and Solar Cells: An International Journal Devoted to Photovoltaic, Photothermal, and Photochemical Solar Energy Conversion >The preparation and characterization of CdS_(1-x)Te_x semiconductor films for hydrogen production by the chemical bath deposition method
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The preparation and characterization of CdS_(1-x)Te_x semiconductor films for hydrogen production by the chemical bath deposition method

机译:化学浴沉积法制氢用CdS_(1-x)Te_x半导体膜的制备与表征

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Te-doped CdS semiconductor films were fabricated on indiumtinoxide (ITO) substrates by chemical bath deposition. The chemical composition, morphology, crystalline, and optical properties of the Te-doped CdS films were characterized by XPS, SEM, XRD, UVvis, and Ellipsometer. Additionally, the carrier density and flat-band potential of the semiconductor electrodes were measured by Hall and potentiostat. Results show that the electrical property of Te-doped CdS films was changed from n-type to p-type semiconductors, when the molar ratios of Te in the bath solution were higher than 0.4. Besides, energy band-gap and carrier densities of the Te-doped samples were found in the range of 1.852.33 eV and 9.68×10~(15)1.56×10~(17) cm~(-3), respectively. Furthermore, the maximum photocurrent density of the samples was found to be -0.81 mA/cm2 (under the external potential of -1.0 V) with the largest hydrogen production capability of 1.29 ml/cm~2, when illuminated under a 150 W Xe lamp.
机译:通过化学浴沉积在铟锡氧化物(ITO)衬底上制备了掺Te的CdS半导体膜。用XPS,SEM,XRD,UVvis和Ellipsometer对掺Te的CdS薄膜的化学组成,形貌,晶体和光学性质进行了表征。另外,通过霍尔和恒电位仪测量半导体电极的载流子密度和平带电势。结果表明,当浴液中Te的摩尔比大于0.4时,掺Te的CdS薄膜的电学性质从n型变为p型。此外,掺Te样品的能带隙和载流子密度分别为1.853.33 eV和9.68×10〜(15)1.56×10〜(17)cm〜(-3)。此外,当在150 W Xe灯下照射时,样品的最大光电流密度为-0.81 mA / cm2(在-1.0 V的外部电势下),最大制氢能力为1.29 ml / cm〜2 。

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