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Degradation phenomena due to humidity in low voltage ZnO varistors

机译:低压ZnO压敏电阻中由于湿度引起的降解现象

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摘要

Humidity-induced degradation in low voltage ZnO varistors was investigated. An experiment was conducted in which some varistors were put-in humid condition with fixed relative humidity of 100 percent at 25 C for a certain period of time. After the treatment, the samples showed serious degradation as their breakdown voltage decreased and their leakage current increased significantly. It was proposed that the diffusion and reaction of H~+ generated by dissociation of water at the surface of ceramics induced the degradation due to humidity. When the degraded low voltage ZnO varistors were subject to 110 percent of maximum continuous operating voltage for 120 h, thermal runaway did not occur in service, and the voltage-current characteristics of these degraded samples could also be mostly restored by polishing process at the side surface of varistors. The experimental results indicated that the diffusion and reaction of H~+ is confined to a surface layer of ceramic varistors.
机译:研究了湿度引起的低压ZnO压敏电阻的退化。进行了一个实验,其中将一些压敏电阻置于潮湿条件下,并在25°C下保持相对湿度100%的固定时间。处理后,样品的击穿电压降低,漏电流显着增加,显示严重降解。有人提出由于水在陶瓷表面的离解而产生的H〜+的扩散和反应引起了由于湿度引起的降解。当退化的低压ZnO压敏电阻在120小时内承受最大连续工作电压的110%时,在使用中不会发生热失控,并且这些退化的样品的电压-电流特性也可以通过侧面的抛光工艺来恢复。压敏电阻表面。实验结果表明,H〜+的扩散和反应仅限于陶瓷压敏电阻的表面层。

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