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Photoluminescence and I-V characteristics of a CdS-nanoparticles-porous-silicon heterojunction

机译:CdS-纳米粒子-多孔硅异质结的光致发光和I-V特性

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Chemically capped CdS nanoparticles are embedded in porous silicon (PS) by a dip coating method. Atomic force microscopy measurements reveal that the PS surface is covered with CdS nanoparticles forming well-defined rectangular blocks of nearly uniform size (200 X 200 nm~2). Photoelectron spectroscopy and energy dispersive x-ray analysis confirm the presence of CdS in PS. Optical and electrical properties of the heterojunctions so-formed are investigated. Junction characteristics show that the composite so-formed exhibits very forward current density (145 mA cm~(-2)) and high reverse breakdown voltage (15 V).
机译:通过浸涂法将化学封端的CdS纳米颗粒嵌入多孔硅(PS)中。原子力显微镜测量显示PS表面被CdS纳米颗粒覆盖,形成了定义明确的矩形块,大小接近均匀(200 X 200 nm〜2)。光电子能谱和能量色散X射线分析证实PS中存在CdS。研究了如此形成的异质结的光学和电学性质。结特性表明,所形成的复合材料表现出非常高的正向电流密度(145 mA cm〜(-2))和较高的反向击穿电压(15 V)。

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