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Effect of carbon tetrabromide on the morphology of GaAs nanowires

机译:四溴化碳对GaAs纳米线形貌的影响

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Carbon is a commonly used p-type dopant in planar III-V semiconductors, however its use in nanowire (NW) growth has been much less reported. In this work we show that the morphology of gold assisted GaAs NWs can be strongly modified by the presence of CBr_4 vapor during growth by metalorganic vapor phase epitaxy. GaAs NWs were grown under conditions which result in strong tapering and lateral growth at low growth temperatures by the use of triethylgallium (TEGa) instead of the more usual precursor, trimethylgallium (TMGa). Under these conditions, NWs grown in the presence of CBr_4 exhibit higher axial and lower radial growth rates, and negligible tapering compared with NWs grown in the absence of CBr_4 under the same conditions. We attribute this primarily to the suppression of the 2d growth rate by CBr_4, which enhances the axial growth rate of the nanowires. NWs grown with CBr_4 show stacking-fault-free zincblende structure, while the NWs grown without CBr_4 show a high density of stacking faults. This work underlines the striking effects which precursor chemistry can have on nanowire morphology.
机译:碳是平面III-V半导体中常用的p型掺杂剂,但是,其在纳米线(NW)生长中的用途的报道却很少。在这项工作中,我们表明金辅助的GaAs NW的形态可以通过金属有机气相外延生长过程中CBr_4蒸气的存在而得到强烈修饰。通过使用三乙基镓(TEGa)代替更常用的前体三甲基镓(TMGa),在低生长温度下能导致逐渐变细和横向生长的条件下生长GaAs NW。在这些条件下,与在相同条件下不存在CBr_4的情况下生长的NW相比,在CBr_4存在的情况下生长的NW表现出较高的轴向生长速率和较低的径向生长速率,并且锥度可忽略不计。我们将其主要归因于CBr_4对2d生长速率的抑制,这提高了纳米线的轴向生长速率。用CBr_4生长的NW表现出无堆垛错锌闪锌矿结构,而不使用CBr_4生长的NW表现出高密度的堆垛层错。这项工作强调了前体化学作用对纳米线形态的惊人影响。

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