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The fabrication of metallic tips with a silicon cantilever for probe-based ferroelectric data storage and their durability experiments

机译:带有硅悬臂的金属探针的制造,用于基于探针的铁电数据存储及其耐久性实验

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摘要

This paper reports on the development and evaluation of various probes consisting of silicon cantilevers with different types of tips made of platinum, ruthenium, chromium and conductive CVD diamond for probe-based ultrahigh density ferroelectric data storage. Using the metal-tip probes, data bits on a medium can be written and read with contact operation. Durability experiments of the various tips against a ferroelectric material are performed. The most detrimental tip wear occurred for platinum, while wear was much less apparent for the remaining tips. Reading and writing experiments on an LiTaO_3 plate are also performed on the basis of scanning nonlinear dielectric microscopy using ruthenium- and chromium-tip probes.
机译:本文报道了各种探针的开发和评估,这些探针由硅悬臂组成,具有由铂,钌,铬和导电CVD金刚石制成的不同类型的尖端,用于基于探针的超高密度铁电数据存储。使用金属探针,可以通过接触操作写入和读取介质上的数据位。进行了针对铁电材料的各种尖端的耐久性实验。铂金对针头的磨损最为有害,而其余针头的磨损则少得多。在LiTaO_3板上的读写实验也是在使用钌和铬尖端探针的扫描非线性介电显微镜的基础上进行的。

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