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Scintillator high-gain avalanche rushing photoconductor active-matrix flat panel imager: Zero-spatial frequency x-ray imaging properties of the solid-state SHARP sensor structure

机译:闪烁体高增益雪崩冲积光电导体有源矩阵平板成像仪:固态SHARP传感器结构的零空间频率X射线成像特性

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Purpose: The authors are investigating the feasibility of a new type of solid-state x-ray imaging sensor with programmable avalanche gain: scintillator high-gain avalanche rushing photoconductor active matrix flat panel imager (SHARP-AMFPI). The purpose of the present work is to investigate the inherent x-ray detection properties of SHARP and demonstrate its wide dynamic range through programmable gain. Methods: A distributed resistive layer (DRL) was developed to maintain stable avalanche gain operation in a solid-state HARP. The signal and noise properties of the HARP-DRL for optical photon detection were investigated as a function of avalanche gain both theoretically and experimentally, and the results were compared with HARP tube (with electron beam readout) used in previous investigations of zero spatial frequency performance of SHARP. For this new investigation, a solid-state SHARP x-ray image sensor was formed by direct optical coupling of the HARP-DRL with a structured cesium iodide (CsI) scintillator. The x-ray sensitivity of this sensor was measured as a function of avalanche gain and the results were compared with the sensitivity of HARP-DRL measured optically. The dynamic range of HARP-DRL with variable avalanche gain was investigated for the entire exposure range encountered in radiographyfluoroscopy (RF) applications. Results: The signal from HARP-DRL as a function of electric field showed stable avalanche gain, and the noise associated with the avalanche process agrees well with theory and previous measurements from a HARP tube. This result indicates that when coupled with CsI for x-ray detection, the additional noise associated with avalanche gain in HARP-DRL is negligible. The x-ray sensitivity measurements using the SHARP sensor produced identical avalanche gain dependence on electric field as the optical measurements with HARP-DRL. Adjusting the avalanche multiplication gain in HARP-DRL enabled a very wide dynamic range which encompassed all clinically relevant medical x-ray exposures. Conclusions: This work demonstrates that the HARP-DRL sensor enables the practical implementation of a SHARP solid-state x-ray sensor capable of quantum noise limited operation throughout the entire range of clinically relevant x-ray exposures. This is an important step toward the realization of a SHARP-AMFPI x-ray flat-panel imager.
机译:目的:作者正在研究具有可编程雪崩增益的新型固态X射线成像传感器的可行性:闪烁器高增益雪崩冲积光电导体有源矩阵平板成像仪(SHARP-AMFPI)。本工作的目的是研究SHARP固有的X射线检测特性,并通过可编程增益演示其广泛的动态范围。方法:开发了分布式电阻层(DRL),以在固态HARP中维持稳定的雪崩增益操作。从理论上和实验上研究了用于光子检测的HARP-DRL的信号和噪声特性与雪崩增益的关系,并将其结果与先前用于零空间频率性能研究的HARP管(带电子束读数)进行了比较。 SHARP。为了进行这项新的研究,通过将HARP-DRL与结构化碘化铯(CsI)闪烁体直接光学耦合,形成了固态SHARP X射线图像传感器。测量该传感器的x射线灵敏度与雪崩增益的关系,并将结果与​​光学测量的HARP-DRL灵敏度进行比较。对于在放射线透视(RF)应用中遇到的整个曝光范围,研究了具有可变雪崩增益的HARP-DRL的动态范围。结果:来自HARP-DRL的信号作为电场的函数显示出稳定的雪崩增益,并且与雪崩过程相关的噪声与理论和先前从HARP管获得的测量结果非常吻合。该结果表明,当与用于X射线检测的CsI耦合时,与HARP-DRL中的雪崩增益相关的额外噪声可以忽略不计。使用SHARP传感器的X射线灵敏度测量产生的雪崩增益对电场的依赖性与使用HARP-DRL进行的光学测量相同。调整HARP-DRL中的雪崩倍增增益可实现非常宽的动态范围,其中涵盖了所有与临床相关的医学X射线照射。结论:这项工作表明,HARP-DRL传感器可以实际实施SHARP固态X射线传感器,该传感器在整个临床相关X射线暴露范围内均具有量子噪声限制的操作。这是朝着实现SHARP-AMFPI X射线平板成像仪迈出的重要一步。

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